Wafer Probe And Test

 

Wafer probing is used to ascertain if the chips in wafer (about 200 pieces) are functional. It is done with the use of a wafer prober, which it automatically positions and aligns the chips with the probe card for testing. The purpose of the probe card is to bridge the wafer and the test system.

 

The prober will detect any defective chips either with an ink dot or generating an electronic wafer map, via automatic pattern recognition optics. Accuracy is vital for this probe. Any failure to meet the published specification is identified by the tester and the device is cataloged as a reject.